Raman Spectroscopy of Optical Properties In Cds Thin Films

Authors

  • J. Trajić Institute of Physics, University of Belgrade
  • M. Gilić Institute of Physics, University of Belgrade
  • N. Romčević Institute of Physics, University of Belgrade
  • M. Romčević Institute of Physics, University of Belgrade
  • G. Stanišić Institute of Physics, University of Belgrade
  • B. Hadžić Institute of Physics, University of Belgrade
  • M. Petrović Institute of Physics, University of Belgrade
  • Y.S. Yahia Nano–Science and Semiconductor Labs., Department of Physics, Faculty of Education, Ain Shams University

Abstract

Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We apply Raman scattering to investigate optical properties of CdS thin films, and reveal existence of surface optical phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture were modeled by Maxwell – Garnet approximation.

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Published

2017-12-13

Issue

Vol. 47 No. 2 (2015)

Section

Articles

License

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