Optical Properties of Zigzag Nickel Nanostructures Obtained at Different Deposition Angles
In this study, nickel (Ni) thin films were deposited at two different angles (65o and 85o) using Glancing Angle Deposition technique, to the thicknesses of 60 – 290 nm. Structural analysis of the deposited films was performed by scanning electron microscopy and X-ray diffraction, while spectroscopic ellipsometry was used for the investigation of optical properties. Electrical resitivity of the samples was determined by four-point probe method. Structural analysis showed that the Ni films grow in a shape of zigzag nanocolumns, where the deposition angle strongly affects their porosity. As the thickness of the films increase they absorb light strongly and become less dense. Besides, samples deposited at the angle of 85o exhibit higher values of electrical resistivity as compared to the samples deposited at the angle of 65o, which can be correlated with high porosity and the growth mechanism of the deposited nanostructures.
Authors retain copyright of the published article and have the right to use the article in the ways permitted to third parties under the Creative Commons Attribution 4.0 International license. Full bibliographic information (authors, article title, journal title, volume, issue, pages) about the original publication must be provided and a link must be made to the article's DOI. This license allows to copy and redistribute the material in any medium or format, remix, transform, and build upon it for any purpose, even commercially, as long as appropriate credit is given to the original author(s), a link to the license is provided and it is indicated if changes were made.